1.
VLSI Test Principles And Architectures Design for Testability
by Wang, Laung-Terng, Wu, Chen...
ISBN: 9780123705976
List Price: $77.95
2.
Electronic Design Automation
by Wang, Laung-Terng, Wang, La...
ISBN: 9780123743640
List Price: $89.95
3.
System-on-Chip Test Architectures: Nanometer Design for Testability
by Wang, Laung-Terng, Touba, N...
ISBN: 9780123739735
List Price: $72.95
4.
VLSI Test Principles and Architectures: Design for Testability
by Laung-Terng Wang, Cheng-Wen...
ISBN: 9781493300860
List Price: $89.95
OUT OF STOCK
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System-on-chip Test Architectures: Nanometer Design for Testability
by Stroud, Charles, Wang, Laun...
ISBN: 9780080556802
OUT OF STOCK
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Vlsi Test Principles and Architectures: Design for Testability
by Wang, Laung-terng, Wen, Xia...
ISBN: 9780080474793