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9781493300860

VLSI Test Principles and Architectures: Design for Testability

VLSI Test Principles and Architectures: Design for Testability
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Product details

  • ISBN-13: 9781493300860
  • ISBN: 1493300865
  • Edition: 1
  • Publication Date: 2006
  • Publisher: Morgan Kaufmann

AUTHOR

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

SUMMARY

Laung-Terng Wang is the author of 'VLSI Test Principles and Architectures: Design for Testability', published 2006 under ISBN 9781493300860 and ISBN 1493300865.

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