Transmission Electron Energy Loss Spectrometry in Materials Science and the Eels Atlas

Electron Energy Loss Spectrometry(EELS), a highly effective technique for materials microanalysis under the transmission electron microscope, has advanced tremendously in recent years with increasing promise for use with semiconductors and other high-tech materials. Now, the Second Edition of this volume - a leading reference on EELS applications that includes the valuable EELS Atlas database - sheds light on major innovations in instrumentation, techniques, and applications for this versatile spectroscopic method. With many new chapters authored by respected materials scientists, the new edition of this respected reference encompasses both general principles of EELS and its uses with particular classes of materials - metals, ceramics, minerals, polymers, semiconductors, and magnetic materials. Highlights include: CD-ROM with the EELS Atlas - a digital reference library of EELS spectra for almost all elements on the periodic table as well as many oxides and compounds CD-ROM also includes examples of energy-filtered images from a large range of materials Contributions from leading authorities in materials science and engineering Extensive new coverage of energy-filtered imaging Up-to-date coverage of high quantum efficiency parallel detection systems New treatment of advanced spectroscopic imaging techniques Extensive bibliography including relevant literature for each chapter With strong emphasis on specific applications of EELS, the Second Edition of this highly regarded volume gives working scientists and students in materials science, engineering, solid-state physics and chemistry, and many associated fields a complete toolbox for utilizing EELS in their own research.Ahn, Channing C. is the author of 'Transmission Electron Energy Loss Spectrometry in Materials Science and the Eels Atlas', published 2004 under ISBN 9783527405657 and ISBN 3527405658.