4748513
9783540269090
'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.Bhushan, Bharat is the author of 'Applied Scanning Probe Methods III Characterization', published 2006 under ISBN 9783540269090 and ISBN 3540269096.
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