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9781441909374

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Product details

  • ISBN-13: 9781441909374
  • ISBN: 1441909370
  • Edition: 1
  • Publication Date: 2009
  • Publisher: Springer

AUTHOR

Girard, Patrick, Bosio, Alberto, Dilillo, Luigi

SUMMARY

Girard, Patrick is the author of 'Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies', published 2009 under ISBN 9781441909374 and ISBN 1441909370.

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