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Combat Identification Modeling Using Robust Optimization Techniques
by Taeho Kim
ISBN: 9781288327676
List Price: $49.00
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Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manuf...
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ISBN: 9780792381075
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China's Arms Acquisitions from Abroad: A Quest for "Superb and Secret Weapons" (Stockholm In...
by Gill, Bates, Kim, Taeho
ISBN: 9780198291954
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Reliability, Yield, and Stress Burn-In
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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manu...
by Way Kuo, Wei-Ting Kary Chie...
ISBN: 9781461375968
List Price: $309.00
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China's Arms Acquisitions from Abroad A Quest for 'Supreb and Secret Weapons'
by Gill, Bates, Kim, Taeho
ISBN: 9780198291961
List Price: $62.50